The goal of this research is to measure mechanical properties of graphene grown under different conditions which may affect the quality, grain sizes, and the number of layers of graphene. The mechanical properties of graphene are measured in many ways, yet conventional mechanical tensile testing of graphene sheets is difficult due to one atomic thickness of graphene and difficulties in handling graphene tensile specimen in nanoscale. We propose implementing Microelectromechanical System (MEMS) based tensile tester to accurately measure the mechanical properties of suspended graphene from strain versus stress curve.
Figures
(a) Overview of LPCVD (Low Pressure Chemical Vapor Deposition) furnace which a graphene growth system
(b) Schematic of the region where graphene is synthesized on Copper thin film (or foil)
(c) Layout of MEMS tensile tester for testing mechanical strength of graphene
(d) Graphene suspended between stages of MEMS tensile tester (inset: (a) Raman spectroscopy mapping of graphene (b) Raman spectrum on monolayer graphene
(e) Detailed view of graphene suspended between MEMS stages